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PerkinElmer received US Patent No. 6,631,211, “Interactive system for analyzing scatter plots.” The patent covers a system that can be used to analyze data from microarray experiments. A scanner system analyses data plotted in accordance with user-specified criteria or statistical measures from the data population, to produce a scatter plot that displays boundaries for the selection of outlier points and/or otherwise visually denotes in the plotted data which points are the outlier points.

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