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Cuno Inc., Industrial Technology Research Institute, Affymetrix, Hitachi Software Engineering

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Cuno Inc. of Meriden, Conn., received US Patent No. 6,734,012, "Low fluorescence nylon/glass composites for micro-analytical diagnostic applications." The patent covers a method for constructing composite microarray non-luminescent slides with a microporous membrane attached by covalent bonding through a surface treatment to a substrate. Apparatus and methods for fabricating non-luminescent composite microarray slides are also disclosed.


Industrial Technology Research Institute of Taiwan received US Patent No. 6,733,894 "High-density functional slide and preparation method thereof." The patent covers a method for preparing a high-density functional slide by coating a sol-gel containing amine-group bearing silanes and a solution containing polyaldehyde groups onto an organic or inorganic substrate, respectively. The resulting slide is useful in the preparation of highly homogeneous functional-group slides and the high-density and high-efficiency bio-chip/microarray.


Affymetrix received US Patent No. 6,733,969, "Expression monitoring for gene function identification." This invention provides methods for mapping the regulatory relationship among genes by massive parallel monitoring of gene expression. Mutations in the upstream regulatory genes are detected by monitoring the change in downstream gene expression. In addition, regulatory function of a target gene can be determined by monitoring the expression of a large number of downstream genes. The invention also provides specific embodiments for detecting p53 functional homozygous and heterozygous mutations and for determining the function of p53 mutations.


Hitachi Software Engineering received US Patent No. 6,733,968, "Microarray, method for producing the same, and method for correcting inter-pin spotting amount error of the same." The patent covers a system that corrects inter-pin spotting errors resulting from microarraying production. In microarray production, samples are immobilized on a microarray support using all pins as controls for correcting the inter-pin spotting amount errors. After the microarray experiments, luminescent intensities of the samples used as control spots for correcting the inter-pin spotting amount errors are measured and used to obtain correction parameters for the inter-pin spotting amount errors. These parameters are used to correct luminescent intensities of other samples.