Canon Kabushiki Kaisha of Tokyo received US Patent No. 6,737,238, “Substrate measuring method and device.” The patent covers a method of measuring a sample on a substrate that makes it possible to simplify the control and construction of a measuring device, shorten the measuring period, make the measuring conditions constant, and improve the positional accuracy. The method is performed by forming a circular orbit of detection areas.

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The Washington Post reports on a Federal Bureau of Investigation plan to place rapid DNA analyzers at booking stations around the country.

In an editorial, officials from scientific societies in the US and China call for the international community to develop criteria and standards for human germline editing.

The US National Institutes of Health is to review studies that have received private support for conflicts of interest, according to the New York Times.

In Science this week: the PsychENCODE Consortium reports on the molecular mechanisms of neuropsychiatric disorders, and more.