Applied Precision, PriTest, The Commissariat a l Energie Atomique and Universite Joseph Fourier de Grenoble, and Fujitsu of Kawasaki | GenomeWeb

Applied Precision of Issaquah, Wash., has received US Patent No. 6,862,363, “Image metrics in the statistical analysis of DNA microarray data.” The patent covers probability density distributions generated by pixel-by-pixel analysis of microarray images that can be used to measure the precision with which spot intensities are determined.

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